The Effect of Subbandgap Illumination on the Bulk Resistivity of CdZnTe
Journal Article
·
· Journal of Electronic Materials
The variation in bulk resistivity during infrared (IR) illumination above 950 nm of state-of-the-art CdZnTe (CZT) crystals grown using the traveling heating method or the modified Bridgman method is documented. The change in steady-state current with and without illumination is also evaluated. The influence of secondary phases (SP) on current-voltage (I-V) characteristics is discussed using IR transmission microscopy to determine the defect concentration within the crystal bulk. SP present within the CZT are connected to the existence of deep, IR-excitable traps within the bandgap.
- Research Organization:
- Savannah River Site (SRS), Aiken, SC (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC09-08SR22470
- OSTI ID:
- 1097608
- Report Number(s):
- SRNL-STI-2013-00475
- Journal Information:
- Journal of Electronic Materials, Journal Name: Journal of Electronic Materials Journal Issue: 11 Vol. 42; ISSN 0361-5235
- Publisher:
- Springer
- Country of Publication:
- United States
- Language:
- English
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