Improving the performance of high-laser-damage-threshold, multilayer dielectric pulse-compression gratings through low-temperature chemical cleaning

Howard, Heather P.; Aiello, Anthony F.; Dressler, Justin G.; Edwards, Nicholas R.; Kessler, Terrance J.; Kozlov, Alexei A.; Manwaring, Ian T.; Marshall, Kenneth L.; Oliver, James B.; Papernov, Semyon; Rigatti, Amy L.; Roux, Alycia N.; Schmid, Ansgar W.; Slaney, Nicholas P.; Smith, Christopher C.; Taylor, Brittany N.; Jacobs, Stephen D.

doi:10.1364/ao.52.001682

Improving the performance of high-laser-damage-threshold, multilayer dielectric pulse-compression gratings through low-temperature chemical cleaning

Journal Article · Wed Mar 06 23:00:00 EST 2013 · Applied Optics

DOI:https://doi.org/10.1364/ao.52.001682· OSTI ID:1095103

Howard, Heather P. ^[1]; Aiello, Anthony F.; Dressler, Justin G.; Edwards, Nicholas R.; Kessler, Terrance J.; Kozlov, Alexei A.; Manwaring, Ian T.; Marshall, Kenneth L.; Oliver, James B.; Papernov, Semyon; Rigatti, Amy L.; Roux, Alycia N.; Schmid, Ansgar W.; Slaney, Nicholas P.; Smith, Christopher C.; Taylor, Brittany N.; Jacobs, Stephen D.

Laboratory for Laser Energetics, University of Rochester, Rochester, NY

A low-temperature chemical cleaning approach has been developed to improve the performance of multilayer dielectric pulse-compressor gratings for use in the OMEGA EP laser system. X-ray photoelectron spectroscopy results guided the selection of targeted cleaning steps to strip specific families of manufacturing residues without damaging the grating's fragile 3D profile. Grating coupons that were cleaned using the optimized method consistently met OMEGA EP requirements on diffraction efficiency and 1054 nm laser-damage resistance at 10 ps. The disappearance of laser-conditioning effects for the highest-damage-threshold samples suggests a transition from a contamination-driven laser-damage mechanism to defect-driven damage for well-cleaned components.

Research Organization:: Univ. of Rochester, NY (United States). Lab. for Laser Energetics

Sponsoring Organization:: USDOE

DOE Contract Number:: FC52-08NA28302

OSTI ID:: 1095103

Report Number(s):: DOE/NA/28302-1103; 2012-157; 2076

Journal Information:: Applied Optics, Journal Name: Applied Optics Journal Issue: 8 Vol. 52; ISSN 1559-128X

Publisher:: Optical Society of America

Country of Publication:: United States

Language:: English

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