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Title: Special issue on Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III , E-MRS Spring 2012 Symposium W, held in Strasbourg, France, May 14 18, 2012

Conference ·
OSTI ID:1093108
 [1];  [2];  [3];  [3];  [4];  [5]
  1. Tyndall National Institute, University College Cork, Ireland
  2. Université Européenne de Bretagne, France
  3. ORNL
  4. CNR/University of Parma, Italy
  5. Research Institute for Technical Physics and Materials, Hungary

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
DE-AC05-00OR22725
OSTI ID:
1093108
Resource Relation:
Conference: E-MRS, Strasbourg, DC, USA, 20120514, 20120518
Country of Publication:
United States
Language:
English