SAAF: SANS data Analysis using Analytical Functions

Journal Article · Sat Jan 01 00:00:00 EST 2011 · Journal of Applied Crystallography

DOI:https://doi.org/10.1107/S0021889811046188· OSTI ID:1092162

Zhao, Jinkui ^[1]

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1. ORNL

The recently completed Extended Q-Range Small Angle Scattering Diffractometer (EQ-SANS) has put the focus on its software needs with renewed urgency. In a series of efforts, we aim at providing a complete set of software solutions on the EQ-SANS instrument. These programs include initial data processing, data correction and reduction, analytical model fitting to the scattering data, Monte Carlo simulation for structure determination, and virtual instrument simulation for experiment planning. SAAF is one such program for analytical data modeling. It takes the reduced EQ-SANS data and allows users to fit the data to analytical models. These models are easy to write. They can either be user written, or from the pre-supplied model library.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Spallation Neutron Source (SNS)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1092162
• Journal Information: Journal of Applied Crystallography, Vol. 44, Issue 6; ISSN 0021--8898
• Country of Publication: United States
• Language: English

Related Subjects

SANS
EQ-SANS
SNS
Data reduction
Data Analysis