skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: In situ radial X-ray diffraction study of texture and stress during phase transformations in bcc-, fcc- and hcp-iron up to 36 GPa and 1000 K

Journal Article · · Acta Mater.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Organization:
OTHERFOREIGNNSFUNIVERSITY
OSTI ID:
1089017
Journal Information:
Acta Mater., Vol. 61, Issue (14) ; 08, 2013
Country of Publication:
United States
Language:
ENGLISH

Similar Records

STUDY OF THIN FILMS OF YTTERBIUM BY X-RAY AND ELECTRON DIFFRACTION: DIRECT OBSERVATION OF THE fcc reversible hcp MARTENSITIC TRANSFORMATION STUDY OF PHASE STABILITY.
Journal Article · Sat Jan 01 00:00:00 EST 1972 · Thin Solid Films 10: No. 2, 229-42(May 1972). · OSTI ID:1089017

Impurity and texture driven HCP-to-FCC transformations in Ti-X thin films during in situ TEM annealing and FIB milling
Journal Article · Sat Feb 01 00:00:00 EST 2020 · Acta Materialia · OSTI ID:1089017

IN SITU X-RAY DIFFRACTION STUDY OF SILICON AT PRESSURES UP TO 15.5 GPA AND TEMPERATURES UP TO 1073 K
Journal Article · Wed Jan 01 00:00:00 EST 2003 · Physical Review, B: Condensed Matter · OSTI ID:1089017

Related Subjects