An Optical Streak Diagnostic for Observing Anode-Cathode Plasmas for Radiographic Source Development

Conference · Thu Jun 13 04:00:00 EDT 2013

OSTI ID:1087682

Droemer, Darryl W. ^[1]; Crain, Marlon D.; Lare, Gregory A. ^[1]; Bennett, Nichelle L. ^[1]; Johnston, Mark D. ^[2]

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1. National Security Technologies, LLC
2. Sandia National Laboratories

National Security Technologies, LLC, and Sandia National Laboratories are collaborating in the development of pulsed power–driven flash x-ray radiographic sources that utilize high-intensity electron beam diodes. The RITS 6 (Radiographic Integrated Test Stand) accelerator at Sandia is used to drive a self magnetic pinch diode to produce a Bremsstrahlung x-ray source. The high electric fields and current densities associated with these short A-K gap pinch beam diodes present many challenges in diode development. Plasmas generated at both the anode and cathode affect the diode performance, which is manifested in varying spot (source) sizes, total dose output, and impedance profiles. Understanding the nature of these plasmas including closure rates and densities is important in modeling their behavior and providing insight into their mitigation. In this paper we describe a streak camera–based optical diagnostic that is capable of observing and measuring plasma evolution within the A-K gap. By imaging a region of interest onto the input slit of a streak camera, we are able to produce a time-resolved one-dimensional image of the evolving plasma. Typical data are presented.

• Research Organization: Nevada Test Site/National Security Technologies, LLC (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC52-06NA25946
• OSTI ID: 1087682
• Report Number(s): DOE/NV/25946--1802
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
radiographic diode
optical streak
diagnostic