Reliability Model Development for Photovoltaic Connector Lifetime Prediction Capabilities.

Conference · Sat Jun 01 00:00:00 EDT 2013

DOI:https://doi.org/10.1109/PVSC.2013.6744115· OSTI ID:1083087

Yang, Benjamin Bing-Yeh; Sorensen, Neil R; Robinson, David Gerald; Granata, Jennifer E; Burton, Patrick D; Taylor, Jason Mark; Kilgo, Alice C.

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1083087
• Report Number(s): SAND2013-4705C; 456193
• Country of Publication: United States
• Language: English