Dielectric properties of lead lanthanum zirconate titanate thin films with and without zro2 insertion layers

Journal Article · Tue Jan 01 00:00:00 EST 2013 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4804170· OSTI ID:1080164

Liu, S.; Ma, B.; Narayanan, M.; Tong, S.; Koritala, R. E.; Hu, Z.; Balachandran, U. ^[1]

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1. Energy Systems

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: EERE
• DOE Contract Number: DE-AC02-06CH11357
• OSTI ID: 1080164
• Report Number(s): ANL/ES/CP-75972
• Journal Information: Journal of Applied Physics, Vol. 113, Issue 17 ; 2013
• Country of Publication: United States
• Language: ENGLISH