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Near-edge X-ray Absorption Fine Structure Spectroscopy Studies of Charge Redistribution at Graphene/dielectric Interfaces

Journal Article · · Journal of Vacuum Sci. and Tech. B: Microelect. and Nanometer Structure
DOI:https://doi.org/10.1116/1.4726508· OSTI ID:1069637
; ; ; ; ; ; ;
N/A
Research Organization:
BROOKHAVEN NATIONAL LABORATORY (BNL)
Sponsoring Organization:
USDOE SC OFFICE OF SCIENCE (SC)
DOE Contract Number:
AC02-98CH10886
OSTI ID:
1069637
Report Number(s):
BNL--100209-2013-JA
Journal Information:
Journal of Vacuum Sci. and Tech. B: Microelect. and Nanometer Structure, Journal Name: Journal of Vacuum Sci. and Tech. B: Microelect. and Nanometer Structure Journal Issue: 4 Vol. 30; ISSN 2166-2746
Country of Publication:
United States
Language:
English

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