Characterizing the Stoichiometry of Extremely Thin and Potentially Radiation Hard Memristive Ta&%231722O5-x Films.
Conference
·
OSTI ID:1067622
Abstract Not Provided
- Research Organization:
- Sandia National Laboratories
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1067622
- Report Number(s):
- SAND2012-3243C
- Country of Publication:
- United States
- Language:
- English
Similar Records
Characterization of Switching Filament Formation in TaOx Memristive Memory Films.
Fabrication and characterization of PLZT 12/X/Y thin films.
Thermal Transport in TaOx Films for Memristive Applications.
Conference
·
Sat Nov 01 00:00:00 EDT 2014
·
OSTI ID:1242129
Fabrication and characterization of PLZT 12/X/Y thin films.
Conference
·
Mon Aug 01 00:00:00 EDT 2005
·
OSTI ID:969595
Thermal Transport in TaOx Films for Memristive Applications.
Conference
·
Mon Jun 01 00:00:00 EDT 2015
·
OSTI ID:1260377