Preemptible I/O Scheduling of Garbage Collection for Solid State Drives
- ORNL
- Georgia Institute of Technology
Abstract Unlike hard disks, flash devices use out-of-update operations and they require a garbage collection (GC) process to reclaim invalid pages to create free blocks. This GC process is a major cause of performance degradation when running concurrently with other I/O operations as internal bandwidth is consumed to reclaim these invalid pages. The invocation of the GC process is generally governed by a low watermark on free blocks and other internal device metrics that different workloads meet at different intervals. This results in I/O performance that is highly dependent on workload characteristics. In this paper, we examine the GC process and propose a semi-preemptible GC scheme that allows GC processing to be preempted while pending I/O requests in the queue are serviced. Moreover, we further enhance flash performance by pipelining internal GC operations and merge them with pending I/O requests whenever possible. Our experimental evaluation of this semipreemptible GC scheme with realistic workloads demonstrate both improved performance and reduced performance variability. Write-dominant workloads show up to a 66.56% improvement in average response time with a 83.30% reduced variance in response time compared to the non-preemptible GC scheme. In addition, we explore opportunities of a new NAND flash device that supports suspend/resume commands for read, write and erase operations for fully preemptible GC. Our experiments with a fully preemptible GC enabled flash device show that request response time can be improved by up to 14.57% compared to semi-preemptible GC.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). National Center for Computational Sciences (NCCS)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC05-00OR22725
- OSTI ID:
- 1061554
- Journal Information:
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 32, Issue 2
- Country of Publication:
- United States
- Language:
- English
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