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Real-time, high-resolution x-ray diffraction measurements on shocked crystals at a synchrotron facility

Journal Article · · Rev. Sci. Instrum.
DOI:https://doi.org/10.1063/1.4772577· OSTI ID:1061328
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  1. CIW
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Abstract not provided
Research Organization:
Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)
Sponsoring Organization:
NSFDOE - BASIC ENERGY SCIENCESDOE-NNSA
OSTI ID:
1061328
Journal Information:
Rev. Sci. Instrum., Journal Name: Rev. Sci. Instrum. Journal Issue: (12) ; 12, 2012 Vol. 83
Country of Publication:
United States
Language:
ENGLISH

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