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Title: Calibrating Curved Crystals Used for Plasma Spectroscopy

Abstract

The throughput and resolving power of an X-ray spectrometer that uses a curved crystal as the diffraction element is determined primarily by the crystal X-ray reflectivity properties. This poster presents a measurement technique for these crystal parameters using a simple diode source to produce a narrow spectral band. The results from measurements on concave elliptical polyethylene terephthalate (PET) crystals and convex potassium acid phthalate (KAP) crystals show large variations in the key parameters compared to those from the flat crystal.

Authors:
Publication Date:
Research Org.:
Nevada Test Site/National Security Technologies, LLC (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1054938
Report Number(s):
DOE/NV/25946-1642
DOE Contract Number:  
DE-AC52-06NA25946
Resource Type:
Conference
Resource Relation:
Conference: 54th Annual Meeting of the APS Division of Plasma Physics, Providence, RI; November 2, 2012
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; crystals, plasma spectroscopy

Citation Formats

Haugh, M. J., Jacoby, K. D., Ross, P. W., Rochau, G. Wu, M., Regan, S. P., Barrios, M. A. Calibrating Curved Crystals Used for Plasma Spectroscopy. United States: N. p., 2012. Web.
Haugh, M. J., Jacoby, K. D., Ross, P. W., Rochau, G. Wu, M., Regan, S. P., Barrios, M. A. Calibrating Curved Crystals Used for Plasma Spectroscopy. United States.
Haugh, M. J., Jacoby, K. D., Ross, P. W., Rochau, G. Wu, M., Regan, S. P., Barrios, M. A. Mon . "Calibrating Curved Crystals Used for Plasma Spectroscopy". United States. https://www.osti.gov/servlets/purl/1054938.
@article{osti_1054938,
title = {Calibrating Curved Crystals Used for Plasma Spectroscopy},
author = {Haugh, M. J., Jacoby, K. D., Ross, P. W., Rochau, G. Wu, M., Regan, S. P., Barrios, M. A.},
abstractNote = {The throughput and resolving power of an X-ray spectrometer that uses a curved crystal as the diffraction element is determined primarily by the crystal X-ray reflectivity properties. This poster presents a measurement technique for these crystal parameters using a simple diode source to produce a narrow spectral band. The results from measurements on concave elliptical polyethylene terephthalate (PET) crystals and convex potassium acid phthalate (KAP) crystals show large variations in the key parameters compared to those from the flat crystal.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2012},
month = {10}
}

Conference:
Other availability
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