Calibrating Curved Crystals Used for Plasma Spectroscopy
Conference
·
OSTI ID:1054938
The throughput and resolving power of an X-ray spectrometer that uses a curved crystal as the diffraction element is determined primarily by the crystal X-ray reflectivity properties. This poster presents a measurement technique for these crystal parameters using a simple diode source to produce a narrow spectral band. The results from measurements on concave elliptical polyethylene terephthalate (PET) crystals and convex potassium acid phthalate (KAP) crystals show large variations in the key parameters compared to those from the flat crystal.
- Research Organization:
- Nevada Test Site (NTS), Mercury, NV (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- DE-AC52-06NA25946
- OSTI ID:
- 1054938
- Report Number(s):
- DOE/NV/25946-1642
- Resource Relation:
- Conference: 54th Annual Meeting of the APS Division of Plasma Physics, Providence, RI; November 2, 2012
- Country of Publication:
- United States
- Language:
- English
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