Radiation effects of n-type, low resistivity, spiral silicon drift detector hybrid systems

Journal Article · Sat Oct 01 00:00:00 EDT 2011 · 2011 IEEE Nuclear Science Symposium Conference Record

DOI:https://doi.org/10.1109/NSSMIC.2011.6154663· OSTI ID:1054610

Chen, W.; Carini, G. A.; De Geronimo, G.; Gaskin, J. A.; Keister, J. W.; Li, S.; Li, Z.; Ramsey, B. D.; Siddons, D. P.; Smith, G. C.; Verbitskaya, E.

We have developed a new thin-window, n-type, low-resistivity, spiral silicon drift detector (SDD) array - to be used as an extraterrestrial X-ray spectrometer (in varying environments) for NASA. To achieve low-energy response, a thin SDD entrance window was produced using a previously developed method. These thin-window devices were also produced on lower resistivity, thinner, n-type, silicon material, effectively ensuring their radiation hardness in anticipation of operation in potentially harsh radiation environments (such as found around the Jupiter system). Using the Indiana University Cyclotron Facility beam line RERS1, we irradiated a set of suitable diodes up to 5 Mrad and the latest iteration of our ASICs up to 12 Mrad. Then we irradiated two hybrid detectors consisting of newly, such-produced in-house (BNL) SDD chips bonded with ASICs with doses of 0.25 Mrad and 1 Mrad. Also we irradiated another hybrid detector consisting of previously produced (by KETEK) on n-type, high-resistivity SDD chip bonded with BNL's ASICs with a dose of 1 Mrad. The measurement results of radiated diodes (up to 5 Mrad), ASICs (up to 12 Mrad) and hybrid detectors (up to 1 Mrad) are presented here.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE SC OFFICE OF HIGH ENERGY PHYSICS
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 1054610
• Report Number(s): BNL-96969-2012-JA
• Journal Information: 2011 IEEE Nuclear Science Symposium Conference Record, Vol. 2011, Issue none; Conference: Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE, Valencia (Spain), 23-29 Oct. 2011; ISSN 1082
• Publisher: IEEE
• Country of Publication: United States
• Language: English

Related Subjects

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
radiation effects
low resistivity
spiral silicon drift detector
application specific integrated circuits
silicon radiation detectors
ASIC iteration
Indiana University Cyclotron Facility
RERS1 beam line
extraterrestrial X-ray spectrometer
harsh radiation environments
high-resistivity SDD chip
hybrid detectors
n-type radiation effects
radiation hardness
silicon drift detector
silicon material
spiral SDD array
spiral hybrid systems
thin-window devices
Annealing
CMOS integrated circuits
Irrigation
Noise
Noise measurement
Protons
Temperature measurement