Chapter 12: Electron Microscopy on Thin Films for Solar Cells

Abou-Ras, D; Nichterwitz, M; Romero, M J; Schmidt, S S

doi:10.1002/9783527636280.ch12

Chapter 12: Electron Microscopy on Thin Films for Solar Cells

Book · Sat Jan 01 04:00:00 EST 2011

DOI:https://doi.org/10.1002/9783527636280.ch12· OSTI ID:1053296

Abou-Ras, D; Nichterwitz, M; Romero, M J; Schmidt, S S

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Research Organization:: National Renewable Energy Laboratory (NREL), Golden, CO (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy Solar Energy Technologies Program

DOE Contract Number:: AC36-08GO28308

OSTI ID:: 1053296

Report Number(s):: NREL/CH-520-48196

Country of Publication:: United States

Language:: English

References (60)

Characterization of the CdS/Cu(In,Ga)Se2 interface by electron beam induced currents Kniese, Robert; Powalla, Michael; Rau, Uwe Thin Solid Films, Vol. 515, Issue 15 https://doi.org/10.1016/j.tsf.2006.12.045	journal	May 2007
Kilovolt Electron Energy Loss Distribution in GaAsP Oelgaet, G.; Werner, U. Physica Status Solidi (a), Vol. 85, Issue 1 https://doi.org/10.1002/pssa.2210850125	journal	September 1984
Projected potential profiles across interfaces obtained by reconstructing the exit face wave function from through focal series Bhattacharyya, Somnath; Koch, Christoph T.; Rühle, Manfred Ultramicroscopy, Vol. 106, Issue 6 https://doi.org/10.1016/j.ultramic.2006.01.007	journal	April 2006
Characterisation of thin film CdS/CdTe solar cells using electron and optical beam induced current Galloway, S. A.; Edwards, P. R.; Durose, K. Solar Energy Materials and Solar Cells, Vol. 57, Issue 1 https://doi.org/10.1016/S0927-0248(98)00168-8	journal	February 1999
Comparison of electrical and luminescence data for the A center in CdTe Castaldini, A.; Cavallini, A.; Fraboni, B. Applied Physics Letters, Vol. 69, Issue 23 https://doi.org/10.1063/1.117228	journal	December 1996
Characterising superstrate CIS solar cells with electron beam induced current Rechid, J.; Kampmann, A.; Reineke-Koch, R. Thin Solid Films, Vol. 361-362 https://doi.org/10.1016/S0040-6090(99)00793-2	journal	February 2000
Electron Energy-Loss Spectroscopy in the Electron Microscope Egerton, R. F. https://doi.org/10.1007/978-1-4757-5099-7	book	January 1996
EBIC investigations of junction activity and the role of oxygen in CdS/CuInSe2 devices Matson, R. J.; Noufi, R.; Ahrenkiel, R. K. Solar Cells, Vol. 16 https://doi.org/10.1016/0379-6787(86)90106-7	journal	January 1986
EBIC and luminescence mapping of CdTe/CdS solar cells Edwards, P. R.; Galloway, S. A.; Durose, K. Thin Solid Films, Vol. 361-362 https://doi.org/10.1016/S0040-6090(99)00821-4	journal	February 2000
Kilovolt electron energy loss distribution in Si Werner, U.; Koch, F.; Oelgart, G. Journal of Physics D: Applied Physics, Vol. 21, Issue 1 https://doi.org/10.1088/0022-3727/21/1/017	journal	January 1988
Improvements in the X-Ray Analytical Capabilities of a Scanning Transmission Electron Microscope by Spherical-Aberration Correction Watanabe, M.; Ackland, D. W.; Burrows, A. Microscopy and Microanalysis, Vol. 12, Issue 6 https://doi.org/10.1017/S1431927606060703	journal	October 2006
Model based quantification of EELS spectra Verbeeck, J.; Van Aert, S. Ultramicroscopy, Vol. 101, Issue 2-4 https://doi.org/10.1016/j.ultramic.2004.06.004	journal	November 2004
Investigation of minority‐carrier diffusion lengths by electron bombardment of Schottky barriers Wu, C. J.; Wittry, D. B. Journal of Applied Physics, Vol. 49, Issue 5 https://doi.org/10.1063/1.325163	journal	May 1978
Application of the ionless tripod polisher to the preparation of YBCO superconducting multilayer and bulk ceramics thin films Ayache, J.; Albarède, P. H. Ultramicroscopy, Vol. 60, Issue 2 https://doi.org/10.1016/0304-3991(95)00073-8	journal	September 1995
Application of scanning electron microscopy to determination of surface recombination velocity: GaAs Jastrzebski, L.; Lagowski, J.; Gatos, H. C. Applied Physics Letters, Vol. 27, Issue 10 https://doi.org/10.1063/1.88276	journal	November 1975
First application of Cc-corrected imaging for high-resolution and energy-filtered TEM Kabius, B.; Hartel, P.; Haider, M. Journal of Electron Microscopy, Vol. 58, Issue 3 https://doi.org/10.1093/jmicro/dfp021	journal	April 2009
Identification of the chlorine A center in CdTe Hofmann, D. M.; Omling, P.; Grimmeiss, H. G. Physical Review B, Vol. 45, Issue 11 https://doi.org/10.1103/PhysRevB.45.6247	journal	March 1992
Evaluation of diffusion lengths and surface recombination velocities from electron beam induced current scans Donolato, C. Applied Physics Letters, Vol. 43, Issue 1 https://doi.org/10.1063/1.94139	journal	July 1983
The temperature distribution in a thin metal film exposed to an electron beam Röll, Klaus Applications of Surface Science, Vol. 5, Issue 4 https://doi.org/10.1016/0378-5963(80)90103-8	journal	August 1980
Cathodoluminescence study of the spatial distribution of electron‐hole pairs generated by an electron beam in Al _0.4 Ga _0.6 As Bonard, Jean‐Marc; Ganière, Jean‐Daniel; Akamatsu, Brigitte Journal of Applied Physics, Vol. 79, Issue 11 https://doi.org/10.1063/1.362560	journal	June 1996
Field-emission SEM imaging of compositional and doping layer semiconductor superlattices Perovic, D. D.; Castell, M. R.; Howie, A. Ultramicroscopy, Vol. 58, Issue 1 https://doi.org/10.1016/0304-3991(94)00183-N	journal	April 1995
Silicon solar cell designs based on physical behavior in concentrated sunlight Fossum, J. G.; Burgess, E. L.; Lindholm, F. A. Solid-State Electronics, Vol. 21, Issue 5 https://doi.org/10.1016/0038-1101(78)90005-9	journal	May 1978
Correction of aberrations, a promising means for improving the spatial and energy resolution of energy-filtering electron microscopes Rose, H. Ultramicroscopy, Vol. 56, Issue 1-3 https://doi.org/10.1016/0304-3991(94)90142-2	journal	November 1994
Electron holography approaching atomic resolution Lichte, Hannes Ultramicroscopy, Vol. 20, Issue 3 https://doi.org/10.1016/0304-3991(86)90193-2	journal	January 1986
Evaluation of diffusion-recombination parameters in electrodeposited CuIn(S, Se)2 solar cells by means of electron beam induced current experiments and modelling Sieber, B.; Ruiz, C. M.; Bermudez, V. Superlattices and Microstructures, Vol. 45, Issue 4-5 https://doi.org/10.1016/j.spmi.2008.12.016	journal	April 2009
The development of Fresnel contrast analysis, and the interpretation of mean inner potential profiles at interfaces Dunin-Borkowski, Rafal E. Ultramicroscopy, Vol. 83, Issue 3-4 https://doi.org/10.1016/S0304-3991(00)00015-2	journal	June 2000
A reciprocity theorem for charge collection Donolato, C. Applied Physics Letters, Vol. 46, Issue 3 https://doi.org/10.1063/1.95654	journal	February 1985
Direct observation of potential distribution across Si/Si p ‐ n junctions using off‐axis electron holography McCartney, M. R.; Smith, David J.; Hull, Robert Applied Physics Letters, Vol. 65, Issue 20 https://doi.org/10.1063/1.112581	journal	November 1994
Interdependence of absorber composition and recombination mechanism in Cu(In,Ga)(Se,S)2 heterojunction solar cells Turcu, M.; Pakma, O.; Rau, U. Applied Physics Letters, Vol. 80, Issue 14 https://doi.org/10.1063/1.1467621	journal	April 2002
Electron‐beam‐generated carrier distributions in semiconductor multilayer structures Mohr, H.; Dunstan, D. J. Journal of Microscopy, Vol. 187, Issue 2 https://doi.org/10.1046/j.1365-2818.1997.2190778.x	journal	August 1997
Qualitative and Quantitative Analysis of Thin Film Heterostructures by Electron Beam Induced Current Scheer, R. Solid State Phenomena, Vol. 67-68 https://doi.org/10.4028/www.scientific.net/SSP.67-68.57	journal	April 1999
Off-axis and inline electron holography: Experimental comparison Latychevskaia, Tatiana; Formanek, Petr; Koch, C. T. Ultramicroscopy, Vol. 110, Issue 5 https://doi.org/10.1016/j.ultramic.2009.12.007	journal	April 2010
Evaluation of diffusion length and surface‐recombination velocity from a planar‐collector‐geometry electron‐beam‐induced current scan Kuiken, H. K.; van Opdorp, C. Journal of Applied Physics, Vol. 57, Issue 6 https://doi.org/10.1063/1.334400	journal	March 1985
Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials Everhart, T. E.; Hoff, P. H. Journal of Applied Physics, Vol. 42, Issue 13 https://doi.org/10.1063/1.1660019	journal	December 1971
Evaluation of electron beam induced current profiles of Cu(In,Ga)Se2 solar cells with different Ga-contents Kniese, Robert; Powalla, Michael; Rau, Uwe Thin Solid Films, Vol. 517, Issue 7 https://doi.org/10.1016/j.tsf.2008.11.049	journal	February 2009
Scanning Electron Microscopy Reimer, Ludwig Springer Series in Optical Sciences https://doi.org/10.1007/978-3-662-13562-4	book	January 1985
Beam injection methods for characterizing thin-film solar cells Romero, Manuel J.; Al-Jassim, Mowafak M.; Dhere, Ramesh G. Progress in Photovoltaics: Research and Applications, Vol. 10, Issue 7 https://doi.org/10.1002/pip.437	journal	January 2002
Microstructural and chemical studies of interfaces between Cu(In,Ga)Se2 and In2S3 layers Abou-Ras, D.; Rudmann, D.; Kostorz, G. Journal of Applied Physics, Vol. 97, Issue 8 https://doi.org/10.1063/1.1863454	journal	April 2005
An alternative proof of the generalized reciprocity theorem for charge collection Donolato, C. Journal of Applied Physics, Vol. 66, Issue 9 https://doi.org/10.1063/1.343932	journal	November 1989
EBIC studies of grain boundaries Holt, D. B.; Raza, B.; Wojcik, A. Materials Science and Engineering: B, Vol. 42, Issue 1-3 https://doi.org/10.1016/S0921-5107(96)01678-9	journal	December 1996
Diffusion length measurements on n ‐CuInS ₂ crystals by evaluation of electron‐beam‐induced current profiles in edge‐scan and planar configurations Scheer, R.; Lewerenz, H. J. Journal of Applied Physics, Vol. 77, Issue 5 https://doi.org/10.1063/1.358836	journal	March 1995
Minority carrier diffusion length and edge surface‐recombination velocity in InP Hakimzadeh, Roshanak; Bailey, Sheila G. Journal of Applied Physics, Vol. 74, Issue 2 https://doi.org/10.1063/1.354936	journal	July 1993
Tutorial on Off-Axis Electron Holography Lehmann, Michael; Lichte, Hannes Microscopy and Microanalysis, Vol. 8, Issue 6 https://doi.org/10.1017/S1431927602029938	journal	December 2002
New Horizons of Applied Scanning Electron Microscopy Shimizu, Kenichi; Mitani, Tomoaki Springer Series in Surface Sciences https://doi.org/10.1007/978-3-642-03160-1	book	January 2010
Analytical Transmission Electron Microscopy Sigle, Wilfried Annual Review of Materials Research, Vol. 35, Issue 1 https://doi.org/10.1146/annurev.matsci.35.102303.091623	journal	August 2005
Energy-Filtering Transmission Electron Microscopy Reimer, Ludwig Springer Series in Optical Sciences https://doi.org/10.1007/978-3-540-48995-5	book	January 1995
Evaluation of diffusion length at different excess carrier concentrations Cavalcoli, D.; Cavallini, A. Materials Science and Engineering: B, Vol. 24, Issue 1-3 https://doi.org/10.1016/0921-5107(94)90306-9	journal	May 1994
Focal-series reconstruction in HRTEM: simulation studies on non-periodic objects Thust, A.; Coene, W. M. J.; Op de Beeck, M. Ultramicroscopy, Vol. 64, Issue 1-4 https://doi.org/10.1016/0304-3991(96)00011-3	journal	August 1996
Transmission Electron Microscopy Williams, David B.; Carter, C. Barry https://doi.org/10.1007/978-0-387-76501-3	book	January 2009
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy Muller, D. A.; Kourkoutis, L. F.; Murfitt, M. Science, Vol. 319, Issue 5866 https://doi.org/10.1126/science.1148820	journal	February 2008
Influence of grain boundaries on current collection in Cu(In,Ga)Se2 thin-film solar cells Nichterwitz, M.; Abou-Ras, D.; Sakurai, K. Thin Solid Films, Vol. 517, Issue 7 https://doi.org/10.1016/j.tsf.2008.11.064	journal	February 2009
Determination of the complex dielectric function of epitaxial SrTiO3 films using transmission electron energy-loss spectroscopy Ryen, L.; Wang, X.; Helmersson, U. Journal of Applied Physics, Vol. 85, Issue 5 https://doi.org/10.1063/1.369602	journal	March 1999
Characterisation of direct epitaxial silicon thin film solar cells on a low-cost substrate Liang, Z. C.; Shen, H.; Xu, N. S. Solar Energy Materials and Solar Cells, Vol. 80, Issue 2 https://doi.org/10.1016/j.solmat.2003.04.001	journal	October 2003
Transmission Electron Microscopy Reimer, Ludwig Springer Series in Optical Sciences https://doi.org/10.1007/978-3-662-21556-2	book	January 1993
Correlating the structural, chemical, and optical properties at nanometer resolution Gu, L.; Özdöl, V. B.; Sigle, W. Journal of Applied Physics, Vol. 107, Issue 1 https://doi.org/10.1063/1.3275048	journal	January 2010
EELS quantification near the single-atom detection level Krivanek, Ondrej L.; Mory, Claudie; Tence, Marcel Microscopy Microanalysis Microstructures, Vol. 2, Issue 2-3 https://doi.org/10.1051/mmm:0199100202-3025700	journal	January 1991
TEM Sample Preparation and FIB-Induced Damage Mayer, Joachim; Giannuzzi, Lucille A.; Kamino, Takeo MRS Bulletin, Vol. 32, Issue 5 https://doi.org/10.1557/mrs2007.63	journal	May 2007
Penetration and energy-loss theory of electrons in solid targets Kanaya, K.; Okayama, S. Journal of Physics D: Applied Physics, Vol. 5, Issue 1 https://doi.org/10.1088/0022-3727/5/1/308	journal	January 1972
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit Kisielowski, C.; Freitag, B.; Bischoff, M. Microscopy and Microanalysis, Vol. 14, Issue 5 https://doi.org/10.1017/S1431927608080902	journal	September 2008
Scanning Probe Microscopy in Materials Science Meyer, Ernst; Jarvis, Suzanne P.; Spencer, Nicholas D. MRS Bulletin, Vol. 29, Issue 7 https://doi.org/10.1557/mrs2004.137	journal	July 2004

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Chapter 12: Electron Microscopy on Thin Films for Solar Cells

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