Effects of unreconstructed and reconstructed polar surface terminations on growth, structure, and magnetic properties of hematite films

Cheung, S. H.; Celik-Aktas, A.; Dey, P.; Pande, K.; Weinert, M.; Kabius, B.; Keavney, D. J.; Lazarov, V. K.; Chambers, S. A.; Gajdardziska-Josifovska, M.

doi:10.1103/physrevb.85.045405

Effects of unreconstructed and reconstructed polar surface terminations on growth, structure, and magnetic properties of hematite films

Journal Article · Thu Jan 05 04:00:00 EST 2012 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/physrevb.85.045405· OSTI ID:1051021

Cheung, S. H. ^[1]; Celik-Aktas, A.; Dey, P.; Pande, K.; Weinert, M.; Kabius, B.; Keavney, D. J.; Lazarov, V. K.; Chambers, S. A.; Gajdardziska-Josifovska, M.

University of Wisconsin-Milwaukee

The effects of polar surface stabilization mechanisms on the film growth, phase composition, surface and interface structure, and magnetic properties are explored for polar oxide interfaces formed by the epitaxial growth of hematite films on magnesia and alumina single crystals. Growth of +-Fe2O3(0001) on the (3)° and (2-2) reconstructed MgO(111) surfaces results in formation of a self-organized Fe3O4(111) interfacial nano buffer that persists after growth. The interfacial magnetite-like phase is absent from the hematite films formed on hydrogen-stabilized unreconstructed MgO(111)-(1-1) and on Al2O3(0001)-(1-1) surfaces under equivalent conditions. This study suggests that in addition to the customary strain, spin, and band-gap engineering, control of surface polarity stabilization could also be important for electronic and magnetic device engineering.

Research Organization:: Univ. of Wisconsin, Milwaukee, WI (United States)

Sponsoring Organization:: USDOE SC Office of Basic Energy Sciences (SC-22)

DOE Contract Number:: FG02-06ER46328

OSTI ID:: 1051021

Report Number(s):: DOE/ER/46328-3

Journal Information:: Physical Review. B, Condensed Matter and Materials Physics, Journal Name: Physical Review. B, Condensed Matter and Materials Physics Journal Issue: 4 Vol. 85; ISSN 1098-0121

Publisher:: American Physical Society (APS)

Country of Publication:: United States

Language:: English

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