Construction of the Magnetic Phase Diagram of FeMn/Ni/Cu(001) Using Photoemission Electron Microscopy
Single crystalline FeMn/Ni bilayer was epitaxially grown on Cu(001) substrate and investigated by photoemission electron microscopy (PEEM). The FeMn and Ni films were grown into two cross wedges to facilitate an independent control of the FeMn (0-20 ML) and Ni (0-20 ML) film thicknesses. The Ni magnetic phases were determined by Ni domain images as a function of the Ni thickness (d{sub Ni}) and the FeMn thickness (d{sub FeMn}). The result shows that as the Ni thickness increases, the Ni film undergoes a paramagnetic-to-ferromagnetic state transition at a critical thickness of d{sub FM} and an in-plane to out-of-plane spin reorientation transition at a thicker thickness d{sub SRT}. The phase diagram shows that both d{sub FM} and d{sub SRT} increase as the FeMn film establishes its antiferromagnetic order.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
- Sponsoring Organization:
- Advanced Light Source Division
- DOE Contract Number:
- AC02-05CH11231
- OSTI ID:
- 1050981
- Report Number(s):
- LBNL-5046E
- Journal Information:
- IEEE Transactions on Magnetics, Journal Name: IEEE Transactions on Magnetics Journal Issue: 6 Vol. 47; ISSN IEMGAQ; ISSN 0018-9464
- Country of Publication:
- United States
- Language:
- English
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