skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Combined experimental and computational study of the recrystallization process induced by electronic interactions of swift heavy ions with silicon carbide crystals

Journal Article · · Physical Review B
 [1];  [2];  [1];  [3];  [4];  [1];  [5];  [6];  [2];  [6];  [6];  [1];  [7]
  1. Universite Paris Sud, Orsay, France
  2. University of Tennessee, Knoxville (UTK)
  3. ORNL
  4. CEA-CNRS-ENSICAEN-University of Caen, FRANCE
  5. SPCTS, Limoges Cedex, France
  6. University of Helsinki
  7. LMGP, CNRS-Grenoble, France

The healing effect of intense electronic energy deposition arising during swift heavy ion (SHI) irradiation is demonstrated in the case of 3C-SiC damaged by nuclear energy deposition. Experimental (ion channeling experiments) and computational (molecular dynamics simulations) studies provide consistent indications of disorder decrease after SHI irradiation. Furthermore, both methods establish that SHI-induced recrystallization takes place at amorphous-crystalline interfaces. The recovery process is unambiguously accounted for by the thermal spike phenomenon.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
DE-AC05-00OR22725
OSTI ID:
1050917
Journal Information:
Physical Review B, Vol. 86, Issue 10; ISSN 1098-0121
Country of Publication:
United States
Language:
English