Surface Impedance Measurements of Single Crystal MgB2 Films for Radiofrequency Superconductivity Applications
Journal Article
·
· Superconductor Science and Technology
We report microstructure analyses and superconducting radiofrequency (SRF) measurements of large scale epitaxial MgB{sub 2} films. MgB{sub 2} films on 5 cm dia. sapphire disks were fabricated by a Hybrid Physical Chemical Vapor Deposition (HPCVD) technique. The electron-beam backscattering diffraction (EBSD) results suggest that the film is a single crystal complying with a MgB{sub 2}(0001) {parallel} Al{sub 2}O{sub 3}(0001) epitaxial relationship. The SRF properties of different film thicknesses (200 nm and 350 nm) were evaluated under different temperatures and applied fields at 7.4 GHz. A surface resistance of 9 {+-} 2 {mu}{Omega} has been observed at 2.2 K.
- Research Organization:
- Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- AC05-06OR23177
- OSTI ID:
- 1047482
- Report Number(s):
- JLAB-ACC-12-1492; DOE/OR/23177-1990; SUSTEF; TRN: US201216%%297
- Journal Information:
- Superconductor Science and Technology, Vol. 25, Issue 9; ISSN 0953-2048
- Country of Publication:
- United States
- Language:
- English
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