Soft X-ray Spectroscopy of C60/Copper Phthalocyanine/MoO3 Interfaces: Role of Reduced MoO3 on Energetic Band Alignment and Improved Performance

Journal Article · Sat Dec 31 04:00:00 EST 2011 · Journal of Physical Chemistry C

OSTI ID:1042232

Cho, S; Piper, L; DeMasi, A; Preston, A; Smith, K; Chauhan, K; Hatton, R; Jones, T

The interfacial electronic structure of C{sub 60}/copper phthalocyanine (CuPc)/molybdenum trioxide (MoO{sub 3}) thin films grown in situ on indium tin oxide (ITO) substrates has been studied using synchrotron radiation-excited photoelectron spectroscopy in an attempt to understand the influence of oxide interlayers on the performance of small molecule organic photovoltaic devices. The MoO{sub 3} layer on ITO is found to significantly increase the work function of the substrate and induces large interface dipoles and band bending at the CuPc/MoO{sub 3} interface. The large band bending confirms the formation of an internal potential that assists hole extraction from the CuPc layer to the electrode. The electronic structure of the MoO{sub 3} layer on ITO was also examined using various soft X-ray spectroscopies to probe the conductive nature of the MoO{sub 3} thin film.

• Research Organization: BROOKHAVEN NATIONAL LABORATORY (BNL)
• Sponsoring Organization: USDOE SC OFFICE OF SCIENCE (SC)
• DOE Contract Number: AC02-98CH10886
• OSTI ID: 1042232
• Report Number(s): BNL--97910-2012-JA
• Journal Information: Journal of Physical Chemistry C, Journal Name: Journal of Physical Chemistry C Journal Issue: 42 Vol. 114; ISSN 1932-7447
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
ALIGNMENT
BENDING
DIPOLES
ELECTRONIC STRUCTURE
INDIUM
OXIDES
PERFORMANCE
PHOTOELECTRON SPECTROSCOPY
PHTHALOCYANINES
PROBES
SUBSTRATES
SYNCHROTRONS
THIN FILMS
TIN OXIDES
WORK FUNCTIONS
X-RAY SPECTROSCOPY