Effect of Enantiomeric Excess on the Phase Behavior of Antiferroelectric Liquid Crystals

Journal Article · Sat Dec 31 04:00:00 EST 2011 · Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics (Print)

DOI:https://doi.org/10.1103/PhysRevE.83.060701· OSTI ID:1042131

Pan, L; McCoy, B; Wang, S; Liu, Z; Wang, S; Pindak, R; Huang, C

Null transmission ellipsometry and resonant x-ray diffraction are employed to study the effect of enantiomeric excess (EE) on the phase behavior of antiferroelectric liquid crystal 10OTBBB1M7. Phase sequence, layer spacing, and pitch of the helical structures of the smectic-C*{sub {alpha}} and smectic-C* phases are studied as a function of temperature and EE. Upon reducing EE, a liquid-gas-type critical point of the smectic-C*{sub {alpha}} to smectic-C* transition is observed, as well as the disappearance of the smectic-C*{sub d4} and the smectic-C*{sub d3} phases. Results are analyzed in a mean-field model.

• Research Organization: BROOKHAVEN NATIONAL LABORATORY (BNL)
• Sponsoring Organization: USDOE SC OFFICE OF SCIENCE (SC)
• DOE Contract Number: AC02-98CH10886
• OSTI ID: 1042131
• Report Number(s): BNL--97809-2012-JA
• Journal Information: Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics (Print), Journal Name: Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics (Print) Journal Issue: 6 Vol. 83; ISSN 1539-3755
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELLIPSOMETRY
LIQUID CRYSTALS
X-RAY DIFFRACTION