Direct Measurements of the Penetration Depth in a Superconducting Film using Magnetic Force Microscopy
Journal Article
·
· Applied Physics Letters
OSTI ID:1041786
We report the local measurements of the magnetic penetration depth in a superconducting Nb film using magnetic force microscopy (MFM). We developed a method for quantitative extraction of the penetration depth from single-parameter simultaneous fits to the lateral and height profiles of the MFM signal, and demonstrate that the obtained value is in excellent agreement with that obtained from the bulk magnetization measurements.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE SC OFFICE OF SCIENCE (SC)
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 1041786
- Report Number(s):
- BNL-97464-2012-JA; APPLAB; TRN: US1202707
- Journal Information:
- Applied Physics Letters, Vol. 95, Issue 26; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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