Probing surface and bulk electrochemical processes on the LaAlO3-SrTiO3 interface

Journal Article · Sun Jan 01 00:00:00 EST 2012 · ACS Nano

DOI:https://doi.org/10.1021/nn204960c· OSTI ID:1041078

Kumar, Amit ^[1]; Arruda, Thomas M ^[1]; Kim, Yunseok ^[1]; Ivanov, Ilia N ^[1]; Jesse, Stephen ^[1]; Bark, C ^[2]; Bristowe, Nicholas C ^[3]; Artacho, Emilio ^[3]; Littlewood, Peter B ^[1]; Eom, Professor Chang-Beom ^[2]; Kalinin, Sergei V ^[1]

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1. ORNL
2. University of Wisconsin, Madison
3. University of Cambridge

Local electrochemical phenomena on the surfaces of LaAlO3-SrTiO3 heterostructure are explored using unipolar and bipolar dynamic electrochemical strain microscopy (D-ESM). The D-ESM suggests the presence of at least two distinct electrochemical processes, including fast reversible low-voltage process and slow high-voltage process. The latter process is associated with static surface deformations in the sub-nm regime. These behaviors are compared with Kelvin Probe Force Microscopy hysteresis data. The possible origins of observed phenomena are discussed and these studies suggest that charge-writing behavior in LAO-STO include strong surface/bulk electrochemical component and are more complicated than simple screening by surface adsorbates.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1041078
• Journal Information: ACS Nano, Vol. 6, Issue 5; ISSN 1936--0851
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
HYSTERESIS
MICROSCOPY
PROBES
STRAINS
LAO-STO
ESM
bulk electrochemical processes