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Grazing Incident Small Angle X-ray Scattering: A Metrology to Probe Nanopatterned Surfaces

Journal Article · · Journal of Vacuum Science and Technology B
OSTI ID:1040303
Grazing incident small angle x-ray scattering (GISAXS) and transmission small angle x-ray scattering studies have been carried out on periodic patterns on silicon substrates in order to determine the average morphology and arrangement of the patterned features. The GISAXS pattern exhibited rods of scattering at Bragg positions, discrete and evenly spaced, in the surface plane. The scattered intensity modulations along each rod have been compared with simulated scattering from simple geometrical patterns to obtain quantitative information on the diameter, width, height, and sidewall inclination of the pillars and gratings. The results are in good agreement with real space images obtained with SEM and demonstrate that GISAXS is a powerful technique for characterizing nanoscale arrays used in patterned media, photonics structures, and electronics structures.
Research Organization:
BROOKHAVEN NATIONAL LABORATORY (BNL)
Sponsoring Organization:
USDOE SC OFFICE OF SCIENCE (SC)
DOE Contract Number:
AC02-98CH10886
OSTI ID:
1040303
Report Number(s):
BNL--90520-2010-JA; KC0202010
Journal Information:
Journal of Vacuum Science and Technology B, Journal Name: Journal of Vacuum Science and Technology B Journal Issue: 6 Vol. 27; ISSN 1071-1023
Country of Publication:
United States
Language:
English