In situ x-ray investigation of freestanding nanoscale Cu-Nb multilayers under tensile load.
- X-Ray Science Division
The yield behavior in a freestanding sputter-deposited Cu/Nb multilayer with 30 nm nominal individual layer thickness has been investigated with in situ synchrotron x-ray diffraction during tensile loading. A pronounced elastic-plastic transition is observed with the fraction of plastically yielded grains increasing gradually with strain. Near synchronous yielding is observed in the Cu and Nb grains. The gradual progression in yield behavior is interpreted in terms of residual stresses, and elastic and plastic anisotropy.
- Research Organization:
- Argonne National Laboratory (ANL)
- Sponsoring Organization:
- SC
- DOE Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1038666
- Report Number(s):
- ANL/XSD/JA-66466
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 3 Vol. 94; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- ENGLISH
Similar Records
In situ investigation of free-standing nanoscale Cu-Nb multylayers under tensile load.
Residual strain and texture in free-standing nanoscale Cu-Nb multilayers
Residual strain and texture in free-standing nanoscal Cu-Nb multilayers.
Journal Article
·
Wed Dec 31 23:00:00 EST 2008
· Appl. Phys. Lett.
·
OSTI ID:1004850
Residual strain and texture in free-standing nanoscale Cu-Nb multilayers
Journal Article
·
Mon Oct 15 00:00:00 EDT 2007
· Journal of Applied Physics
·
OSTI ID:21064400
Residual strain and texture in free-standing nanoscal Cu-Nb multilayers.
Journal Article
·
Mon Oct 15 00:00:00 EDT 2007
· J. Appl. Phys.
·
OSTI ID:920565