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First-Principles Study of Impurities in TlBr

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3702574· OSTI ID:1038083

TlBr is a promising semiconductor material for room-temperature radiation detection. Material purification has been the driver for the recent improvement in the TlBr detector performance, mainly reflected by the significant increase in the carrier mobility-lifetime product. This suggests that impurities have significant impact on the carrier transport in TlBr. In this paper, first-principles calculations are used to study the properties of a number of commonly observed impurities in TlBr. The impurity-induced gap states are presented and their effects on the carrier trapping are discussed.

Research Organization:
Oak Ridge National Laboratory (ORNL)
Sponsoring Organization:
NNSA USDOE - National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC05-00OR22725
OSTI ID:
1038083
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 7 Vol. 111; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English

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