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On the hierarchy of planar fault energies in TiAl

Journal Article · · Scripta Metallurgica et Materialia
;  [1]
  1. Univ. of Cambridge (United Kingdom). Dept. of Materials Science and Metallurgy

The combination of computational and experimental weak-beam transmission electron microscopy (WB-TEM) dislocation imaging is suitable to distinguish between the dislocation core models proposed for the [011]-super dislocation in TiAl on the basis of the energy hierarchies (H1) and (H2). The preliminary occupational results presented here suggest that the hierarchy of planar fault energies in Ti-54at.%Al is E{sub CSF}>E{sub APB}>E{sub SISF}{approx}E{sub SESF}, (H2). The value of the antiphase boundary (APB) energy for TiAl is likely to be larger than E{sub APB}>250 mJm-2, whereas the superlattice intrinsic stacking fault (SISF) energy appears to be E{sub SISF} = 140 mJm{sup {minus}2} which is comparable to the superlattice extrinsic stacking fault (SESF) energy, E{sub SESF} = 142 mJm{sup {minus}2}. CSF stands for complex stacking fault.

OSTI ID:
103597
Journal Information:
Scripta Metallurgica et Materialia, Journal Name: Scripta Metallurgica et Materialia Journal Issue: 3 Vol. 33; ISSN 0956-716X; ISSN SCRMEX
Country of Publication:
United States
Language:
English

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