Band Excitation in Scanning Probe Microscopy: Sines of Change

Journal Article · Sat Jan 01 04:00:00 EST 2011 · Journal of Physics D: Applied Physics

DOI:https://doi.org/10.1088/0022-3727/44/46/464006· OSTI ID:1031004

Jesse, Stephen ^[1]; Kalinin, Sergei V ^[1]

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1. ORNL

In three decades since Scanning Probe Microscopy (SPM) methods have entered scientific arena, they have become one of the main tool of nanoscale science and technology by offering the capability for imaging topography, magnetic, electrical, and mechanical properties on the nanometer scale. The vast majority of force-based SPM techniques to date are based on single-frequency sinusoidal excitation and detection. Here, we illustrate the intrinsic limitations of single-frequency detection that stem from the fundamental physics of dynamic systems. Consequently, many aspects of nanoscale materials functionality including quantitative mechanical, magnetic, and electrical measurements, probing dissipative interactions, to name a few remain unexplored. Band excitation is illustrated as a universal alternative to traditional single-frequency techniques that allows quantitative and reliable studies of dissipative and conservative phenomena, and can be universally applied to all ambient and liquid SPM methods.

• Research Organization: Oak Ridge National Laboratory (ORNL); Center for Nanophase Materials Sciences
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1031004
• Journal Information: Journal of Physics D: Applied Physics, Journal Name: Journal of Physics D: Applied Physics Journal Issue: 46 Vol. 44; ISSN 0022-3727
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DETECTION
EXCITATION
MECHANICAL PROPERTIES
MICROSCOPY
PHYSICS
PROBES
TOPOGRAPHY