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Title: Competing Liquid Phase Instabilities during Pulsed Laser Induced Self-Assembly of Copper Rings into Ordered Nanoparticle Arrays on SiO2

Journal Article · · Langmuir
DOI:https://doi.org/10.1021/la203165v· OSTI ID:1028166
 [1];  [2];  [2];  [3];  [4];  [3];  [5]
  1. Univ. of Tennessee, Knoxville, TN (United States). Dept. of Materials Science and Engineering
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS), Nanofabrication Research Lab.
  3. Univ. Nacional del Centro de la Provincia de Buenos Aires (Argentina). Inst. de Fisica Arroyo Seco
  4. New Jersey Inst. of Technology, Newark, NJ (United States). Center for Applied Mathematics and Statistics, Dept. of Mathematical Sciences
  5. Univ. of Tennessee, Knoxville, TN (United States). Dept. of Materials Science and Engineering; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS), Nanofabrication Research Lab.

Nanoscale copper rings of different radii, thicknesses, and widths were synthesized on silicon dioxide thin films and were subsequently liquefied via a nanosecond pulse laser treatment. During the nanoscale liquid lifetimes, the rings experience competing retraction dynamics and thin film and/or Rayleigh-Plateau types of instabilities, which lead to arrays of ordered nanodroplets. Surprisingly, the results are significantly different from those of similar experiments carried out on a Si surface.(1) We use hydrodynamic simulations to elucidate how the different liquid/solid interactions control the different instability mechanisms in the present problem.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
DOE Contract Number:
AC05-00OR22725; DMS-0908158
OSTI ID:
1028166
Journal Information:
Langmuir, Vol. 27, Issue 21; ISSN 0743-7463
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English