Survey of basic XRD applications.
Conference
·
OSTI ID:1021578
This 1/2 day workshop will survey various applications of XRD analysis, including in-situ analyses and neutron diffraction. The analyses will include phase ID, crystallite size and microstrain, preferred orientation and texture, lattice parameters and solid solutions, and residual stress. Brief overviews of high-temperature in-situ analysis, neutron diffraction and synchrotron studies will be included.
- Research Organization:
- Sandia National Laboratories
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1021578
- Report Number(s):
- SAND2010-5033C
- Country of Publication:
- United States
- Language:
- English
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