skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Effect of Electropolishing and Low-Temperature Baking on the Superconducting Properties of Large-Grain Niobium

Conference · · AIP Conf.Proc.
DOI:https://doi.org/10.1063/1.3579230· OSTI ID:1021423

Measurements of superconducting properties such as bulk and surface critical fields and thermal conductivity have been carried out in the temperature range from 2 K to 8 K on large-grain samples of different purity and on a high-purity fine-grain sample, for comparison. The samples were treated by electropolishing and low temperature baking (120° C, 48 h). While the residual resistivity ratio changed by a factor of ~3 among the samples, no significant variation was found in their superconducting properties. The onset field for flux penetration at 2 K, Hffp, measured within a ~30 µm depth from the surface, was ~160 mT, close to the bulk value. The baking effect was mainly to increase the field range up to which a coherent superconducting phase persists on the surface, above the upper critical field.

Research Organization:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
AC05-06OR23177
OSTI ID:
1021423
Report Number(s):
JLAB-ACC-10-1246; DOE/OR/23177-1678; TRN: US201117%%88
Journal Information:
AIP Conf.Proc., Vol. 1352; Conference: 1st International Symposium, SSTIN10, Newport News, USA, September 22-24, 2010
Country of Publication:
United States
Language:
English