Pion-induced Drell-Yan processes and the flavor-dependent EMC effect

Journal Article · Fri Apr 01 04:00:00 EDT 2011 · Phys. Rev. C

DOI:https://doi.org/10.1103/PhysRevC.83.042201· OSTI ID:1021412

Pion-induced Drell-Yan processes are proposed as a potential tool to measure the flavor dependence of the EMC effect, that is, the flavor-dependent modification of quark distributions in the nuclear medium. Existing pionic Drell-Yan data are compared with calculations using a recent model for nuclear quark distributions that incorporates flavor-dependent nuclear effects. While no firm conclusions can yet be drawn, we demonstrate that existing Drell-Yan data seem to imply a flavor dependence of the EMC effect. We highlight how pion-induced Drell-Yan experiments on nuclear targets can access important new aspects of the EMC effect, not probed in deep inelastic scattering, and will therefore provide very stringent constrains for models of nuclear quark distributions. Predictions for possible future pion-induced Drell-Yan experiments are also presented.

• Research Organization: Thomas Jefferson National Accelerator Facility, Newport News, VA (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: AC05-06OR23177
• OSTI ID: 1021412
• Report Number(s): JLAB-PHY-10-1184; DOE/OR/23177-1667; arXiv:1007.3916
• Journal Information: Phys. Rev. C, Journal Name: Phys. Rev. C Journal Issue: 4 Vol. 83; ISSN 0556-2813; ISSN PRVCAN
• Country of Publication: United States
• Language: English

Related Subjects

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
73 NUCLEAR PHYSICS AND RADIATION PHYSICS
DEEP INELASTIC SCATTERING
EMC EFFECT
MODIFICATIONS
QUARKS
TARGETS