Texture of Cobalt Germanides on Ge(100) and Ge(111) and Its Influence on the Formation Temperature
The phase formation of cobalt germanides on Ge(100) and Ge(111) substrates was investigated using in situ X-ray diffraction, starting from room-temperature sputter-deposited Co films. The formation temperature of the CoGe{sub 2} phase was dependent on the substrate orientation. X-ray pole figures and electron backscatter diffraction measurements were used to identify the texture and microstructure of the CoGe{sub 2} and the preceding Co{sub 5}Ge{sub 7} films. A significant difference in preferential orientation was found in the Co{sub 5}Ge{sub 7} films, depending on the substrate orientation. This influences the formation temperature of the CoGe{sub 2} and results in the coexistence of Co{sub 5}Ge{sub 7} and CoGe{sub 2} on Ge(111) in a large temperature window.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
- Sponsoring Organization:
- DOE - OFFICE OF SCIENCE
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 1019787
- Report Number(s):
- BNL-95633-2011-JA; JESOAN; TRN: US201115%%423
- Journal Information:
- Journal of the Electrochemical Society, Vol. 157, Issue 4; ISSN 0013-4651
- Country of Publication:
- United States
- Language:
- English
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