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Title: Quantitative phase retrieval with picosecond X-ray pulses from the ATF Inverse Compton Scattering source

Journal Article · · Optics Express
DOI:https://doi.org/10.1364/OE.19.002748· OSTI ID:1019498

Quantitative phase retrieval is experimentally demonstrated using the Inverse Compton Scattering X-ray source available at the Accelerator Test Facility (ATF) in the Brookhaven National Laboratory. Phase-contrast images are collected using in-line geometry, with a single X-ray pulse of approximate duration of one picosecond. The projected thickness of homogeneous samples of various polymers is recovered quantitatively from the time-averaged intensity of transmitted X-rays. The data are in good agreement with the expectations showing that ATF Inverse Compton Scattering source is suitable for performing phase-sensitive quantitative X-ray imaging on the picosecond scale. The method shows promise for quantitative imaging of fast dynamic phenomena.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States). Accelerator Test Facility
Sponsoring Organization:
DOE - OFFICE OF SCIENCE
DOE Contract Number:
DE-AC02-98CH10886
OSTI ID:
1019498
Report Number(s):
BNL-95098-2011-JA; TRN: US1103647
Journal Information:
Optics Express, Vol. 19, Issue 3; ISSN 1094-4087
Country of Publication:
United States
Language:
English

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