Study of Pixel Area Variations in Fully Depleted Thick CCD
Future wide field astronomical surveys, like Large Synoptic Survey Telescope (LSST), require photometric precision on the percent level. The accuracy of sensor calibration procedures should match these requirements. Pixel size variations found in CCDs from different manufacturers are the source of systematic errors in the flat field calibration procedure. To achieve the calibration accuracy required to meet the most demanding science goals this effect should be taken into account. The study of pixel area variations was performed for fully depleted, thick CCDs produced in a technology study for LSST. These are n-channel, 100 {micro}m thick devices. We find pixel size variations in both row and column directions. The size variation magnitude is smaller in the row direction. In addition, diffusion is found to smooth out electron density variations. It is shown that the characteristic diffusion width can be extracted from the flat field data. Results on pixel area variations and diffusion, data features, analysis technique and modeling technique are presented and discussed.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- DOE - OFFICE OF SCIENCE
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 1019472
- Report Number(s):
- BNL-94958-2011-JA; PSISDG; KA04; TRN: US1103630
- Journal Information:
- Proceedings of SPIE - The International Society for Optical Engineering, Vol. 7742; ISSN 0277-786X
- Country of Publication:
- United States
- Language:
- English
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