High-sensitivity strain mapping around epitaxial oxide nanostructures using scanning x-ray nanodiffraction.

Journal Article · Mon Jun 20 00:00:00 EDT 2011 · Appl. Phys. Lett.

DOI:https://doi.org/10.1063/1.3598443· OSTI ID:1019252

Sun, T; Pan, Z; Xie, S; Cai, Z; Wang, J; Dravid, V P ^[1]

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1. X-Ray Science Division

The generation and presence of strain around nanostructures of oxides is a key to their growth, properties, and functions, but it has been a challenge to experimentally measure its sign, magnitude, and spatial distribution. Combining diffuse scattering with scanning x-ray nanodiffraction, we have mapped the strain distribution in an oxide-on-oxide nanopatterned structure with a high sensitivity (10{sup -4}) and a submicrometer spatial resolution. An edge-induced strain distribution is observed from a sample of CoFe{sub 2}O{sub 4} nanolines epitaxially grown on MgO substrate, which agrees quantitatively with the numerical simulations.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC); National Science Foundation (NSF); State of Illinois; Northwestern Univ.
• DOE Contract Number: DE-AC02-06CH11357
• OSTI ID: 1019252
• Report Number(s): ANL/XSD/JA-70099; TRN: US201114%%722
• Journal Information: Appl. Phys. Lett., Vol. 98, Issue 25 ; Jun. 20, 2011
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
DIFFUSE SCATTERING
DISTRIBUTION
NANOSTRUCTURES
OXIDES
SENSITIVITY
SPATIAL DISTRIBUTION
SPATIAL RESOLUTION
STRAINS