A VXI-based high speed x-ray CCD detector
Conference
·
OSTI ID:10191092
For time-resolved x-ray scattering, one ideally wants a high speed detector that also is capable of giving position sensitive information. Charge Coupled Devices (CCDS) have been used successfully as x-ray detectors. Unfortunately, they are inherently slow because of the serial readout EEV has developed a CCD that has eight channels of parallel readout, thus increasing the speed eight fold. Using state-of-the-art VXI electronics, we have developed a readout system that could read the entire array in 2.5 ms using a 20-MHz readout clock. For testing and characterization the device was clocked at a significantly slower speed of 30 kHz. The data is preamplified and all eight channels of output are simultaneously digitized to 12 bits and stored in buffer memory. The system is controlled by a 486-based PC through an MXI bus and VXI controller using commercially available software. The system is also capable of real-time image display and manipulation.
- Research Organization:
- Argonne National Lab., IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 10191092
- Report Number(s):
- ANL/XFD/CP--80856; CONF-9309256--2; ON: DE94001436
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
43 PARTICLE ACCELERATORS
430303
440101
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ADVANCED PHOTON SOURCE
CHARGE-COUPLED DEVICES
COMPUTERIZED CONTROL SYSTEMS
DESIGN
EXPERIMENTAL FACILITIES AND EQUIPMENT
GENERAL DETECTORS OR MONITORS AND RADIOMETRIC INSTRUMENTS
INTEGRATED CIRCUITS
PREAMPLIFIERS
SCATTERING
TESTING
X-RAY DETECTION
X-RAY DIFFRACTION
430303
440101
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ADVANCED PHOTON SOURCE
CHARGE-COUPLED DEVICES
COMPUTERIZED CONTROL SYSTEMS
DESIGN
EXPERIMENTAL FACILITIES AND EQUIPMENT
GENERAL DETECTORS OR MONITORS AND RADIOMETRIC INSTRUMENTS
INTEGRATED CIRCUITS
PREAMPLIFIERS
SCATTERING
TESTING
X-RAY DETECTION
X-RAY DIFFRACTION