Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM grating spectrometer

Conference · Fri Jul 01 00:00:00 EDT 1994

OSTI ID:10174794

Decker, T A; Montesanti, R C; Bixler, J V; Hailey, C J ^[1]; Kahn, S M ^[1]

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1. Lawrence Livermore National Lab., CA (United States)

A prototype array consisting of eight diffraction gratings has been fabricated for the XMM Reflection Grating Spectrometer. A component of the full spectrometer is an array of approximately 200 diffraction gratings. The diffraction gratings were produced using lightweight silicon carbide substrates and a replication technique. The prototype array was developed and assembled using the same tolerances as the flight arrays which have typical tolerances of 3 {mu}m in translation and sub-arc seconds in rotation. The metrology applied during inspection and assembly included precision linear measurements, full aperture figure measurements, and angular interferometry.

• Research Organization: Lawrence Livermore National Lab., CA (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States); National Aeronautics and Space Administration, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 10174794
• Report Number(s): UCRL-JC-117808; CONF-940723-14; ON: DE94016605
• Resource Relation: Conference: Annual meeting of the Society of Photo-Optical Instrumentation Engineers,San Diego, CA (United States),24-29 Jul 1994; Other Information: PBD: Jul 1994
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
X-RAY SPECTROMETERS
DIFFRACTION GRATINGS
DESIGN
OPTICS
TESTING
SILICON CARBIDES
440600
OPTICAL INSTRUMENTATION