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Title: Ultrasonic thickness measuring imaging system and method

Patent Application ·
OSTI ID:10163544

This invention is comprised of an ultrasonic thickness measuring and imaging system in which an ultrasonic probe for measuring thickness of an object, such as a wall of tube, a computer for controlling movement of the probe in a scanning pattern within the tube and processing an analog signal produced by the probe which is proportional to the tube wall thickness in the scanning pattern and a line scan recorder for producing a record of the tube wall thicknesses measured by the probe in the scanning pattern. The probe is moved in the scanning pattern to sequentially scan circumferentially the interior tube wall at spaced apart adjacent axial locations. The computer processes the analog signal by converting it to a digital signal into a multiplicity of thickness points with each falling in one of a plurality of thickness ranges corresponding to one of plurality of shades of grey. From the multiplicity of quantified thickness points, a line scan recorder connected to the computer generates a pictorial map of tube wall thicknesses with each quantified thickness point thus being obtained from a minute area of the tube wall and representing one pixel of the pictorial map. In the pictorial map of tube wall thicknesses, the pixels represent different wall thicknesses having different shades of grey.

Research Organization:
Knolls Atomic Power Lab., Schenectady, NY (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC12-76SN00052
Assignee:
Dept. of Energy
Patent Number(s):
PATENTS-US-A7565524
Application Number:
ON: DE92017007; PAN: 7-565,524
OSTI ID:
10163544
Resource Relation:
Other Information: PBD: 1990
Country of Publication:
United States
Language:
English