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Flux-pinning related defect structures in melt-processed $$YBa_2Cu_3O_{7-x}$$

Conference ·
OSTI ID:10159002
(HREM was used.) Stacking faults lying parallel to the (001) basal plane are observed near the Y211/Y123 (Y{sub 2}BaCu{sub 5}O/YBa{sub 2}Cu{sub 3}O{sub 7-{delta}}) interfaces in Y123. These stacking faults are produced by either excess single Cu-O layers or double Cu-O and Y-O layers. Y enrichment and Ba depletion were observed near the Y211/Y123 interface; this is consistent with dissolution of trapped Y211. Such diffusion effects and stress due to lattice mismatch at Y211/Y123 interfaces may be the mechanisms for generating stacking faults around the Y211 particles in the Y123 matrix. A new type of defect with displacement vector 1/6[032] or 1/6[302] was also observed. (DLC)
Research Organization:
Oak Ridge National Lab., TN (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
10159002
Report Number(s):
CONF-930822--5; ON: DE93012759
Country of Publication:
United States
Language:
English