CPV Cell Infant Mortality Study: Preprint
Six hundred and fifty CPV cells were characterized before packaging and then after a four-hour concentrated on-sun exposure. An observed fielded infant mortality failure rate was reproduced and attributed to epoxy die-attach voiding at the corners of the cells. These voids increase the local thermal resistance allowing thermal runaway to occur under normal operation conditions in otherwisedefect-free cells. FEM simulations and experiments support this hypothesis. X-ray transmission imaging of the affected assemblies was not found capable of detecting all suspect voids and therefore cannot be considered a reliable screening technique in the case of epoxy die-attach.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- DOE Contract Number:
- AC36-08GO28308
- OSTI ID:
- 1015888
- Report Number(s):
- NREL/CP-5200-51337; TRN: US201112%%34
- Resource Relation:
- Conference: Presented at the 7th International Conference on Concentrating Photovoltaic Systems (CPV-7), 4-6 April 2011, Las Vegas, Nevada
- Country of Publication:
- United States
- Language:
- English
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