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Structural stability of transparent conducting films assembled from length purified single-wall carbon nanotubes

Journal Article · · Journal of Physical Chemistry C
DOI:https://doi.org/10.1021/jp200250j· OSTI ID:1015589
Single-wall carbon nanotube (SWCNT) films show significant promise for transparent electronics applications that demand mechanical flexibility, but durability remains an outstanding issue. In this work, thin membranes of length purified single-wall carbon nanotubes (SWCNTs) are uniaxially and isotropically compressed by depositing them on prestrained polymer substrates. Upon release of the strain, the topography, microstructure, and conductivity of the films are characterized using a combination of optical/fluorescence microscopy, light scattering, force microscopy, electron microscopy, and impedance spectroscopy. Above a critical surface mass density, films assembled from nanotubes of well-defined length exhibit a strongly nonlinear mechanical response. The measured strain dependence reveals a dramatic softening that occurs through an alignment of the SWCNTs normal to the direction of prestrain, which at small strains is also apparent as an anisotropic increase in sheet resistance along the same direction. At higher strains, the membrane conductivities increase due to a compression-induced restoration of conductive pathways. Our measurements reveal the fundamental mode of elasto-plastic deformation in these films and suggest how it might be suppressed.
Research Organization:
North Dakota State University
Sponsoring Organization:
USDOE Assistant Secretary for Energy Efficiency and Renewable Energy (EE)
DOE Contract Number:
FG36-08GO88160
OSTI ID:
1015589
Report Number(s):
DOE/GO/88160-33
Journal Information:
Journal of Physical Chemistry C, Journal Name: Journal of Physical Chemistry C Journal Issue: 10 Vol. 115; ISSN 1932-7447
Country of Publication:
United States
Language:
English

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