X-ray intensity interferometer for undulator radiation

Conference · Tue Dec 31 04:00:00 EST 1991

OSTI ID:10150143

Gluskin, E; McNulty, I; Viccaro, P J ^[1]; Howells, M R ^[2]

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1. Argonne National Lab., IL (United States)
2. Lawrence Berkeley Lab., CA (United States)

Intensity interferometry is well established with visible light but has never been demonstrated with x-radiation. We propose to measure the transverse coherence of an x-ray beam, for the first time, using the method of Hanbury Brown and Twiss. The x-ray interferometer consists of an array of slits, a grazing incidence reflective beamsplitter, a pair of fast multichannel plate detectors and a broadband, low-noise correlator circuit. The NSLS X1 or X13 soft x-ray undulator will supply the partially coherent x-rays. We are developing this technique to characterize the coherence properties of x-ray beams from high brilliance insertion devices at third-generation synchrotron light facilities such as the Advanced Photon Source and the Advanced Light Source. 17 refs.

• Research Organization: Argonne National Lab., IL (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-31109-ENG-38; AC03-76SF00098
• OSTI ID: 10150143
• Report Number(s): ANL/CP--76025; CONF-9110146--19; ON: DE92015184
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
430303
440101
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DESIGN
EXPERIMENTAL FACILITIES AND EQUIPMENT
GENERAL DETECTORS OR MONITORS AND RADIOMETRIC INSTRUMENTS
INTERFEROMETERS
INTERFEROMETRY
LIGHT SOURCES
NSLS
SYNCHROTRON RADIATION
WIGGLER MAGNETS
X RADIATION