Octahedral tilt transitions in relaxed epitaxial Pb(Zr{sub 1-x}Ti{sub x})O{sub 3} films.
- Center for Nanoscale Materials
Relaxed epitaxial {l_brace}100{r_brace}{sub pc} and {l_brace}111{r_brace}{sub pc} oriented films (350 nm) of Pb(Zr{sub 1-x}Ti{sub x})O{sub 3} (0.2 {le} x {le} 0.4) on SrRuO{sub 3}/SrTiO{sub 3} substrates were grown by pulsed laser deposition and studied using high resolution synchrotron X-ray diffraction and transmission electron microscopy. The dielectric behavior and ferroelectric phase transition temperatures of the films were consistent with bulk PZT. However, weak 1/2{l_brace}311{r_brace}{sub pc} reflections in x-ray diffraction profiles were recorded above bulk T{sub Tilt} (as indicated in the Jaffe, Cooke, and Jaffe phase diagram, where pc denotes pseudocubic indices). Moreover, anomalies in the dielectric and ferroelectric response were detected above T{sub Tilt} which are explained by coupling of short coherence or weakly tilted regions to the ferroelectric polarization.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC); National Science Foundation (NSF); Engineering and Physical Science Research Council - UK
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 1014867
- Report Number(s):
- ANL/MSD/JA-70079; TRN: US201111%%387
- Journal Information:
- J. Appl. Phys., Vol. 109, Issue May 2011
- Country of Publication:
- United States
- Language:
- ENGLISH
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