Comparison of synchrotron x-ray microanalysis with electron and proton microscopy for individual particle analysis
Conference
·
OSTI ID:10148359
- Universitaire Instelling Antwerpen, Antwerp (Belgium)
- Vrije Univ., Amsterdam (Netherlands)
- Chicago Univ., IL (United States)
- Brookhaven National Lab., Upton, NY (United States)
- Warwick Univ., Coventry (United Kingdom)
This paper is concerned with the evaluation of the use of synchrotron/radiation induced x-ray fluorescences ({mu}-SRXRF) as implemented at two existing X-ray microprobes for the analysis of individual particles. As representative environmental particulates, National Institutes of Science and Technology (NIST) K227, K309, K441 and K961 glass microspheres were analyzed using two types of X-ray micro probes: the white light microprobe at beamline X26A of the monochromatic (15 keV) X-ray microprobe at station 7.6 of the SRS. For reference, the particles were also analyzed with microanalytical techniques more commonly employed for individual particles analysis such as EPMA and micro-PIXE.
- Research Organization:
- Brookhaven National Lab., Upton, NY (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States); National Aeronautics and Space Administration, Washington, DC (United States); National Science Foundation, Washington, DC (United States); Nederlandse Organisatie voor Zuiver-Wetenschappelijk Onderzoek (ZWO), The Hague (Netherlands); Science and Engineering Research Council, Swindon (United Kingdom); Belgian National Science Fund (Belgium)
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 10148359
- Report Number(s):
- BNL-46335; CONF-910862-8; ON: DE92014690; CNN: Grant EAR 89-15699; Grant NAG 9-106
- Resource Relation:
- Conference: Pacific-international congress on x-ray analytical methods,Honolulu, HI (United States),12-16 Aug 1991; Other Information: PBD: [1991]
- Country of Publication:
- United States
- Language:
- English
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