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Submillimeter and microwave residual losses in epitaxial films of Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O

Conference ·
OSTI ID:10147183
;  [1]; ;  [2]; ;  [3]; ; ;  [4];  [5];  [6];  [7]
  1. Lawrence Livermore National Lab., CA (United States)
  2. Stanford Univ., CA (United States). Dept. of Applied Physics
  3. Conductus, Inc., Sunnyvale, CA (United States)
  4. Bell Communications Research, Inc., Red Bank, NJ (United States)
  5. Sandia National Labs., Albuquerque, NM (United States)
  6. IBM Research Div., San Jose, CA (United States). Almaden Research Center
  7. Superconductor Technologies, Inc., Santa Barbara, CA (United States)
We have used a novel bolometric technique and a resonant technique to obtain accurate submillimeter and microwave residual loss data for epitaxial thin films of YBa{sub 2}Cu{sub 3}O{sub 7}, Tl{sub 2}Ca{sub 2}Ba{sub 2}Cu{sub 3}O{sub 10} and Tl{sub 2}CaBa{sub 2}Cu{sub 2}O{sub 8}. For all films we obtain good agreement between the submillimeter and microwave data, with the residual losses in both the Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O films scaling approximately as frequency squared below {approximately} 1 THz. We are able to fit the losses in the Y-Ba-Cu-O films to a two fluid and a weakly coupled grain model for the a-b planeconductivity, in good agreement with results from a Kramers-Kronig analysis of the loss data.
Research Organization:
Lawrence Berkeley Lab., CA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States); Department of Defense, Washington, DC (United States); Center for Research in Superconductivity and Superconductivity Electronics (United States)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
10147183
Report Number(s):
LBL--33557; CONF-921217--6; ON: DE93010430; CNN: Contract F49620-88-C-004; Contract F49620-88-C-001
Country of Publication:
United States
Language:
English