Combination of ToF-SIMS imaging and AFM to study the early stages of corrosion in Al-Cu thin films

Journal Article · Fri Dec 31 23:00:00 EST 2010 · Corrosion Science

OSTI ID:1014235

Seyeux, A. ^[1]; Missert, Nancy ^[2]; Frankel, Gerald ^[3]; Unocic, Kinga A ^[4]; Klein, L. H. ^[1]; Galtayries, A. ^[1]; Marcus, P ^[1]

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1. Ecole Nationale Superieure de Chimie de Paris
2. Sandia National Laboratories (SNL)
3. Ohio State University
4. ORNL

The pitting corrosion of Al-Cu thin film alloys was investigated using samples that were heat treated in air to form through-thickness Al2Cu particles within an Al-0.5%Cu matrix. Time-of-Flight SIMS (ToF-SIMS) analysis revealed Cu-rich regions 250 - 800 nm in lateral extent near the metal/oxide interface. Following exposure that generated pitting corrosion, secondary electron, secondary ion, and AFM images showed pits with size and density similar to those of the Cu-rich regions. The role of the Cu-rich regions is addressed.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1014235
• Journal Information: Corrosion Science, Journal Name: Corrosion Science Journal Issue: N Vol. 6; ISSN 0010-938X; ISSN CRRSAA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
AIR
ALLOYS
CORROSION
PITTING CORROSION
THIN FILMS