A combined AEM/APFIM characterization of Alloy X-750

Conference · Fri May 01 04:00:00 EDT 1992

OSTI ID:10137372

Burke, M G ^[1]; Miller, M K ^[2]

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1. Westinghouse Science and Technology Center, Pittsburgh, PA (United States)
2. Oak Ridge National Lab., TN (United States)

In the development of advanced alloys for power system applications, the primary emphasis is placed on attaining specific mechanical properties with resistance to environmental attack. An important part of alloy development is the detailed characterization of the microstructure, because it is the composition, size and morphology of the microstructural features that define the mechanical properties of the material. The good mechanical properties of Ni-base superalloys are a result of the formation of fine coherent precipitates. Analytical electron microscopy (AEM) provides important information concerning the type and distribution of the phases in the alloys, but quantitative microchemical analysis for the ultra-fine precipitates is not readily obtainable with conventional AEM techniques. The high optical resolution of the atom probe field-ion microscope (APFIM) make this technique ideally suited to the analysis of the ultra-fine precipitates and surrounding matrix. In this paper, a combined AEM/APFIM study of precipitation in Alloy X-750 is presented.

• Research Organization: Oak Ridge National Lab., TN (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 10137372
• Report Number(s): CONF-920819--7; ON: DE92011049
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102
360103
CARBIDES
ELECTRON MICROSCOPY
INCONEL X750
ION MICROSCOPY
MECHANICAL PROPERTIES
MICROSTRUCTURE
PRECIPITATION
STRUCTURE AND PHASE STUDIES