Double photoionization of helium with synchrotron x-rays: Proceedings

Conference · Sat Jan 01 04:00:00 EST 1994

OSTI ID:10124268

This report contains papers on the following topics: Overview and comparison of photoionization with charged particle impact; The ratio of double to single ionization of helium: the relationship of photon and bare charged particle impact ionization; Double photoionization of helium at high energies; Compton scattering of photons from electrons bound in light elements; Electron ionization and the Compton effect in double ionization of helium; Elimination of two atomic electrons by a single energy photon; Double photoionization of helium at intermediate energies; Double Photoionization: Gauge Dependence, Coulomb Explosion; Single and Double Ionization by high energy photon impact; The effect of Compton Scattering on the double to single ionization ratio in helium; and Double ionization of He by photoionization and Compton scattering. These papers have been cataloged separately for the database.

• Research Organization: Argonne National Lab., IL (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 10124268
• Report Number(s): ANL/PHY--94/1; CONF-9310190--; ON: DE94006737
• Country of Publication: United States
• Language: English

Related Subjects

664400
74 ATOMIC AND MOLECULAR PHYSICS
EXPERIMENTALLY DERIVED INFORMATION ON ATOMIC AND MOLECULAR PROPERTIES
HELIUM
LEADING ABSTRACT
MEETINGS
PHOTOIONIZATION
X RADIATION
X-RAY DIFFRACTION