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Ion beam mixing of titanium overlayers with hydroxyapaptite substrates

Conference ·
OSTI ID:10116057
 [1];  [2]; ; ; ; ; ;  [3]
  1. Cornell Univ., Ithaca, NY (United States). Dept. of Materials Science and Engineering
  2. Los Alamos National Lab., NM (United States)
  3. Arizona State Univ., Tempe, AZ (United States)
The mixing of titanium overlayers with hydroxyapatite (HA) substrates via ion irradiation has been demonstrated. Analysis via secondary ion mass spectroscopy (SIMS) indicates an interfacial broadening of titanium and calcium of the implanted sample compared to that of the unimplanted sample. Attendant to the observed ion beam mixing of titanium into the HA, the oxygen signal of the titanium overlayer increases as a result of ion irradiation. It is supposed that this change is evident of diffusion through the metal layer and possibly from titania formation at the free surface and perovskite formation at the film/substrate interface. This possibility is consistent with thermodynamic predictions. Additionally, the force required to separate the film from the substrate increased as a result of ion irradiation, validating the continued study of ion beam processing of Ti/HA systems towards the improvement of long term fixation of implant devices.
Research Organization:
Los Alamos National Lab., NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States); Department of Defense, Washington, DC (United States)
DOE Contract Number:
W-7405-ENG-36
OSTI ID:
10116057
Report Number(s):
LA-UR--94-4364; CONF-941144--39; ON: DE95005278
Country of Publication:
United States
Language:
English

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